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  • Test engineer — A (hardware) test engineer (TE) is a professional who determines how to create a process that would test a particular product in manufacturing, or related area like RMA department, in order to guarantee that the product will be shipped out with… …   Wikipedia

  • Test fixture — refers to the fixed state used as a baseline for running tests in software testing. The purpose of a test fixture is to ensure that there is a well known and fixed environment in which tests are run so that results are repeatable. Some people… …   Wikipedia

  • Test card — A test card, also known as a test pattern in the UK, North America and Australia, is a television test signal, typically broadcast at times when the transmitter is active but no program is being broadcast (often at startup and closedown). Used… …   Wikipedia

  • test bed — noun Any venue, setup, etc. used for experimentation, testing, proving a concept, etc. Since that set of articles is already fairly complete, they might serve as a good test bed for the different organizational systems we want to try …   Wiktionary

  • In-circuit test — (ICT) is an example of white box testing where an electrical probe tests a populated printed circuit board (PCB), checking for shorts, opens, resistance, capacitance, and other basic quantities which will show whether the assembly was correctly… …   Wikipedia

  • Bell test experiments — The Bell test experiments serve to investigate the validity of the entanglement effect in quantum mechanics by using some kind of Bell inequality. John Bell published the first inequality of this kind in his paper On the Einstein Podolsky Rosen… …   Wikipedia

  • Law School Admission Test — The Law School Admission Test (LSAT) is an examination administered by the Law School Admission Council (LSAC) that attempts to measure logical and verbal reasoning skills. [ [http://www.lsat.com/LSAC.asp?url=lsac/about lsac.asp About the Law… …   Wikipedia

  • Joint Test Action Group — (JTAG) is the usual name used for the IEEE 1149.1 standard entitled Standard Test Access Port and Boundary Scan Architecture for test access ports used for testing printed circuit boards using boundary scan.JTAG was an industry group formed in… …   Wikipedia

  • Built-in self-test — A built in self test (BIST)mechanism within an integrated circuit (IC) is a function that verifies all or a portion of the internal functionality of the IC. For example, a BIST mechanism is provided in advanced fieldbus systems to verify… …   Wikipedia

  • Codec listening test — A codec listening test is a scientific study designed to compare two or more lossy audio codecs, usually with respect to perceived fidelity or compression efficiency. Most tests take the form of a double blind comparison. Commonly used methods… …   Wikipedia

  • Civilization II: Test of Time — Developer(s) MicroProse Publisher(s) Hasbro Interactive Series …   Wikipedia

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