Lapshin

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• Mikhail Lapshin — Mikhail Ivanovich Lapshin (Russian: Михаил Иванович Лапшин) (September 1, 1934–June 17, 2006) was the President of the Altai Republic in Russia from 2002 to 2006. Lapshin was born in Setovka, Altai Krai. He became President of the Altai Republic… …   Wikipedia

• My Friend Ivan Lapshin — (Russian: Мой друг Иван Лапшин) is a 1984 Soviet criminal drama film directed by Aleksei German and produced by Lenfilm. Based on a novel by Yuri German adapted by Eduard Volodarsky. Music composed by Arkadi Gagulashvili, sound by Nikolai… …   Wikipedia

• Ihar Lapshin — Igor Olegovich Lapshin (né le 8 août 1963 à Minsk) est un athlète biélorusse spécialiste du triple saut. Concourant sous les couleurs de l URSS dès le milieu des années 1980, il se distingue durant les Jeux olympiques de 1988 en se… …   Wikipédia en Français

• Igor Lapshin — (born August 8, 1963) is a retired triple jumper who represented the USSR. Best known for his 1988 Olympic silver medal, he also won the 1991 World Indoor Championships as well as one European Indoor title.In July 1988 he achieved a personal best …   Wikipedia

• Atomic force microscope — The atomic force microscope (AFM) or scanning force microscope (SFM) is a very high resolution type of scanning probe microscope, with demonstrated resolution of fractions of a nanometer, more than 1000 times better than the optical diffraction… …   Wikipedia

• Scanning tunneling microscope — Image of reconstruction on a clean Gold(100) surface …   Wikipedia

• Microscopio de efecto túnel — Imagen de reconstrucción sobre una superficie limpia de oro (100) …   Wikipedia Español

• Feature-oriented scanning — (FOS)[1][2][3] is a method intended for high precision measurement of nanotopography as well as other surface properties and characteristics on a scanning probe microscope (SPM) using features (objects) of the surface as reference points of the… …   Wikipedia

• ООСЗМ — Особенность ориентированное сканирование (ООС)[1][2] метод прецизионного измерения нанотопографии поверхности, а также других её свойств и характеристик на сканирующем зондовом микроскопе (СЗМ), при котором особенности (объекты) поверхности… …   Википедия

• Объектно-ориентированное сканирование — Особенность ориентированное сканирование (ООС)[1][2] метод прецизионного измерения нанотопографии поверхности, а также других её свойств и характеристик на сканирующем зондовом микроскопе (СЗМ), при котором особенности (объекты) поверхности… …   Википедия

• Feature-oriented positioning — (FOP)[1][2] is a method of precise movement of the scanning microscope probe across the surface under investigation. With this method, surface features (objects) are used as reference points for microscope probe attachment. Actually, FOP is a… …   Wikipedia