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1 scanning ion microscopy
іонна мікроскопія з скануванням (по поверхні об’єкта)English-Ukrainian dictionary of microelectronics > scanning ion microscopy
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2 microscopy
мікроскопія - analytical electron microscopy
- atomic resolution microscopy
- Auger microscopy
- ballistic electron emission microscopy
- high-retolution electron microscopy
- high-resolution transmission electron microscopy
- high-voltage electron microscopy
- optical microscopy
- scanning асoustic microscopy
- scanning Auger microscopy
- scanning electron microscopy SEM
- scanning electron microscopy
- scanning ion microscopy
- scanning probe microscopy SPM
- scanning probe microscopy
- scanning transmission electron microscopy
- scanning tunnel microscopy
- transmission electron microscopy
- weak-beam microscopyEnglish-Ukrainian dictionary of microelectronics > microscopy
См. также в других словарях:
Scanning voltage microscopy — (SVM) sometimes also called nanopotentiometry is a scientific experimental technique based on atomic force microscopy. A conductive probe, usually only a few nanometers wide at the tip, is placed in full contact with an operational electronic or… … Wikipedia
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Scanning electron microscope — These pollen grains taken on an SEM show the characteristic depth of field of SEM micrographs … Wikipedia
Scanning tunneling microscope — Image of reconstruction on a clean Gold(100) surface … Wikipedia
Scanning Helium Ion Microscope — Ein Helium Ionen Mikroskop (auch: Scanning Helium Ion Microscope, SHIM) ist ein bildgebendes Verfahren, welches darauf basiert, dass ein Helium Ionen Strahl das zu untersuchende Objekt abtastet[1]. Das Verfahren ähnelt dem eines… … Deutsch Wikipedia
Transmission electron microscopy — A TEM image of the polio virus. The polio virus is 30 nm in size.[1] Transmission electron microscopy (TEM) is a microscopy technique whereby a beam of electrons is transmitted through an ultra thin specimen, interacting with the specimen as it… … Wikipedia
Near-field scanning optical microscope — Near field scanning optical microscopy (NSOM/SNOM) is a microscopic technique for nanostructure investigation that breaks the far field resolution limit by exploiting the properties of evanescent waves. This is done by placing the detector very… … Wikipedia
Magnetic resonance force microscopy — (MRFM) is an imaging technique that acquires magnetic resonance images (MRI) at nanometer scales, and possibly at atomic scales in the future. MRFM is potentially able to observe protein structures which cannot be seen using X ray crystallography … Wikipedia
Feature-oriented scanning — (FOS)[1][2][3] is a method intended for high precision measurement of nanotopography as well as other surface properties and characteristics on a scanning probe microscope (SPM) using features (objects) of the surface as reference points of the… … Wikipedia