ion+bombardment

См. также в других словарях:

• Ion Beam Mixing — is a process for adhering two multilayers, especially a substrate and deposited surface layer. The process involves bombarding layered samples with doses of ion radiation in order to promote mixing at the interface, and generally serves as a… …   Wikipedia

• Ion plating — is a physical vapor deposition (PVD) process that is sometimes called ion assisted deposition (IAD) or ion vapor deposition (IVD) and is a version of vacuum deposition . Ion plating utilizes concurrent or periodic bombardment of the substrate and …   Wikipedia

• Ion source — An ion source is an electro magnetic device that is used to create charged particles. These are used primarily within mass spectrometers or particle accelerators.Mass spectrometry In mass spectrometry, an ion source is a piece of equipment used… …   Wikipedia

• Ion cannon — In science fiction an ion cannon is a beam weapon that fires beams of ions (particles, i.e. atoms that have been affected in some way as to cause them to gain an electrical charge). Due to its power it is usually classified as a superweapon. An… …   Wikipedia

• Ion — Cation and Anion redirect here. For the particle physics/quantum computing concept, see Anyon. For other uses, see Ion (disambiguation). Hydrogen atom (center) contains a single proton and a single electron. Removal of the electron gives a cation …   Wikipedia

• ion implantation — Electronics. a method of implanting impurities below the surface of a solid, usually a semiconductor, by bombarding the solid with a beam of ions of the impurity. [1960 65] * * * ion implantation noun The introduction of ions into a crystalline… …   Useful english dictionary

• Secondary ion mass spectrometry — Infobox chemical analysis name = Secondary ion mass spectrometry caption =CAMECA IMS3f Magnetic SIMS Instrument acronym = SIMS classification =Mass spectrometry analytes = Solid surfaces, thin films related = Fast atom bombardment… …   Wikipedia

• Static secondary ion mass spectrometry — Static secondary ion mass spectrometry, or static SIMS is a technique for chemical analysis including elemental composition and chemical structure of the uppermost atomic or molecular layer of a solid which may be a metal, semiconductor or… …   Wikipedia

• Fast atom bombardment — Infobox chemical analysis name = Fast atom bombardment mass spectrometry caption =ThermoQuest AvantGarde MS with quadropule detector and FAB/EI source. acronym = FAB classification =Mass spectrometry analytes = manufacturers = related = Secondary …   Wikipedia

• Fast Atom Bombardment — (FAB) ist ein Ionisierungsverfahren, das in Massenspektrometern (MS) benutzt wird. Dabei wird eine Lösung des Analyts in einer flüssigen schwer flüchtigen Matrix mit einem Partikelstrom aus gewöhnlich inerten Gasen wie Argon oder Xenon… …   Deutsch Wikipedia

• mass spectrometry — or mass spectroscopy Analytic technique by which chemical substances are identified by sorting gaseous ions by mass using electric and magnetic fields. A mass spectrometer uses electrical means to detect the sorted ions, while a mass spectrograph …   Universalium