-
21 analysis
- analysis of observations
- analysis of optical spectrum - activation analysis
- a-posteriori analysis
- approximate analysis
- a-priori analysis
- automatic number analysis
- batch circuit analysis
- behavioral analysis
- binding-time analysis
- bottom-up analysis
- cepstral analysis
- cipher analysis
- circuit analysis
- cluster analysis
- combinatorial analysis
- comparative analysis
- compatibility analysis
- complex analysis
- content analysis
- contingency analysis
- conversational analysis
- cost analysis
- cost/benefit analysis
- covariance analysis
- critical path analysis
- crystal analysis
- cyclic analysis
- dataflow analysis
- decision-tree analysis
- dimensional analysis
- discourse analysis
- discriminant analysis
- display data analysis
- domain analysis
- EDX analysis
- electron diffraction analysis
- electron probe analysis
- empirical analysis
- energy-dispersive X-ray analysis
- error analysis
- factor analysis
- failure analysis - fluorescence analysis
- Fourier analysis
- fractal image analysis
- frequency analysis
- frequency-domain analysis
- frequency-response analysis
- functional analysis
- fuzzy analysis
- fuzzy logic analysis
- harmonic analysis
- incremental circuit analysis
- interactive signal analysis
- interferometric analysis
- interval analysis
- joint analysis
- Kaplan-Meier analysis
- kernel discriminant analysis
- k-means cluster analysis
- large-signal analysis
- laser microprobe analysis
- linear two-group discriminant analysis
- linguistic analysis
- logic analysis
- logistic analysis
- logit analysis
- log-linear analysis
- luminescent analysis
- magnetic neutron diffraction analysis
- malfunction analysis
- mathematical analysis
- matrix analysis
- maximum-likelihood analysis
- means/ends analysis
- memory operating characteristic analysis
- mesh analysis
- meta-analysis
- microprobe analysis
- mixed-level analysis
- mixed-mode analysis
- modified nodal analysis
- Monte-Carlo analysis
- morphological analysis
- multifactor analysis of variance
- multilevel analysis
- multimode analysis
- multiple discriminant analysis
- multivariate analysis
- network analysis
- nodal analysis
- numerical analysis - operation analysis
- path analysis
- phase-plane analysis
- photon analysis
- photothermoelectric analysis
- policy analysis - probabilistic analysis
- problem analysis
- protocol analysis
- qualitative analysis
- quantitative analysis
- radar signal analysis
- radiographic analysis
- radiometric analysis
- randomized block analysis of variance
- receiver operating characteristic analysis
- regression analysis
- regression correlation analysis
- repeated measures analysis of variance
- requirements analysis
- risk analysis
- sampling analysis
- set analysis
- signature analysis
- single-mode analysis
- small-signal analysis
- sound analysis
- sparse table analysis
- spectral analysis
- spectrophotometric analysis
- spectrum signature analysis
- speech analysis
- static analysis
- statistical analysis
- sticky analysis
- structural analysis
- structured analysis
- structured systems analysis
- survival analysis
- syntactic analysis
- syntactical analysis
- system analysis
- system analysis in control
- tensor analysis
- time-domain analysis
- time-to-event analysis
- top-down analysis
- topological analysis
- traffic analysis
- trend analysis
- two-factor factorial analysis of variance
- wave-length dispersive X-ray analysis
- weighted analysis
- what if analysis
- worst-case analysis
- X-ray analysis
- X-ray spectral analysis
- X-ray structure analysis -
22 analysis
- a posteriori analysis
- a priori analysis
- activation analysis
- analysis of covariance
- analysis of means
- analysis of observations
- analysis of optical spectrum
- analysis of variance
- approximate analysis
- automatic number analysis
- batch circuit analysis
- behavioral analysis
- binding-time analysis
- bottom-up analysis
- cepstral analysis
- cipher analysis
- circuit analysis
- cluster analysis
- combinatorial analysis
- comparative analysis
- compatibility analysis
- complex analysis
- content analysis
- contingency analysis
- conversational analysis
- cost analysis
- cost/benefit analysis
- covariance analysis
- critical path analysis
- crystal analysis
- cyclic analysis
- dataflow analysis
- decision-tree analysis
- dimensional analysis
- discourse analysis
- discriminant analysis
- display data analysis
- domain analysis
- EDX analysis
- electron diffraction analysis
- electron probe analysis
- empirical analysis
- energy-dispersive X-ray analysis
- error analysis
- factor analysis
- failure analysis
- failure mode and effects analysis
- fault-tree analysis
- feature analysis
- finite element analysis
- flow analysis
- fluorescence analysis
- Fourier analysis
- fractal image analysis
- frequency analysis
- frequency-domain analysis
- frequency-response analysis
- functional analysis
- fuzzy analysis
- fuzzy logic analysis
- harmonic analysis
- incremental circuit analysis
- interactive signal analysis
- interferometric analysis
- interval analysis
- joint analysis
- Kaplan-Meier analysis
- kernel discriminant analysis
- k-means cluster analysis
- large-signal analysis
- laser microprobe analysis
- linear two-group discriminant analysis
- linguistic analysis
- logic analysis
- logistic analysis
- logit analysis
- log-linear analysis
- luminescent analysis
- magnetic neutron diffraction analysis
- malfunction analysis
- mathematical analysis
- matrix analysis
- maximum-likelihood analysis
- means/ends analysis
- memory operating characteristic analysis
- mesh analysis
- meta-analysis
- microprobe analysis
- mixed-level analysis
- mixed-mode analysis
- modified nodal analysis
- Monte-Carlo analysis
- morphological analysis
- multifactor analysis of variance
- multilevel analysis
- multimode analysis
- multiple discriminant analysis
- multivariate analysis
- network analysis
- nodal analysis
- numerical analysis
- object-oriented analysis
- off-line circuit analysis
- operation analysis
- path analysis
- phase-plane analysis
- photon analysis
- photothermoelectric analysis
- policy analysis
- predictable failure analysis
- principal components analysis
- probabilistic analysis
- problem analysis
- protocol analysis
- qualitative analysis
- quantitative analysis
- radar signal analysis
- radiographic analysis
- radiometric analysis
- randomized block analysis of variance
- receiver operating characteristic analysis
- regression analysis
- regression correlation analysis
- repeated measures analysis of variance
- requirements analysis
- risk analysis
- sampling analysis
- set analysis
- signature analysis
- single-mode analysis
- small-signal analysis
- sound analysis
- sparse table analysis
- spectral analysis
- spectrophotometric analysis
- spectrum signature analysis
- speech analysis
- static analysis
- statistical analysis
- sticky analysis
- structural analysis
- structured analysis
- structured systems analysis
- survival analysis
- syntactic analysis
- syntactical analysis
- system analysis in control
- system analysis
- tensor analysis
- time-domain analysis
- time-to-event analysis
- top-down analysis
- topological analysis
- traffic analysis
- trend analysis
- two-factor factorial analysis of variance
- wave-length dispersive X-ray analysis
- weighted analysis
- what if analysis
- worst-case analysis
- X-ray analysis
- X-ray spectral analysis
- X-ray structure analysisThe New English-Russian Dictionary of Radio-electronics > analysis
-
23 form
1) анкета; бланк2) вид; форма || придавать вид или форму3) контур; очертание4) конфигурация6) строит. опалубка; элемент опалубки7) скамейка, лавочка8) формуляр9) составлять; образовывать10) формироваться•calculation in a series form — матем. вычисление с помощью ряда
evaluation of indeterminate form — матем. раскрытие неопределённости
fraction in a factored form — матем. дробь в форме разложения на множители
in an expanded form — в виде ряда; в развёрнутом виде
integration in a closed form — матем. интегрирование в конечном виде
of closed form — матем. в конечном виде, с конечным числом членов
preparation of type form — полигр. чернение набора
reduction to a normal form — матем. приведение к нормальной форме
to bring into a canonical form — матем. приводить к канонической форме; приводить к каноническому виду
to form a circle — замыкаться в кольцо; образовывать кольцо
to rearrange in the form — переписывать в виде; преобразовывать к виду ( об уравнениях)
- absolutely convergent form - absolutely extreme form - definite form - elementary form - elimination form of inverse - everywhere regular form - evolutionary operation form - geodesic curvature form - indefinite form - p-adically equivalent form - relatively bounded form - repair request form - third fundamental form - totally definite form - totally discontinuous formto take on a form — принимать форму; принимать вид
-
24 principle
1) правило; принцип2) закон3) начало, первооснова, (перво)источник•- distributed maximum principle - least number principle - principle of adiabatic invariance - principle of contraction mapping - principle of extension of inequalities - principle of fixed point - principle of harmonic balance - principle of harmonic measure - principle of hyperbolic measure - principle of least squares - principle of length and area - principle of mathematical induction - principle of maximum likelihood - principle of point estimation - principle of stationary phase - principle of stochastic balance - principle of transfinite induction - principle of unsufficient reason - virtual work principle - weak likelihood principle -
25 electrical characteristics of assemblies
электрические характеристики НКУ
-
[Интент]Параллельные тексты EN-RU
The Standard IEC 60439-1 identifies the nominal characteristics to be assigned to each assembly, defines the environmental service conditions, establishes the mechanical requirements and gives prescriptions about:
• insulation
• thermal behaviour
• short-circuit withstand strength
• protection against electrical shock
• degree of protection of the enclosure
• installed components, internal separation and connections inside the assembly
• electronic equipment supply circuits.
Information specified under items a) and b) shall be given on the nameplate according to the Standard.
Information from items c) to t), where applicable, shall be given either on the nameplates or in the technical documentation of the manufacturer:
a) manufacturer ’s name or trade mark;
b) type designation or identification number, or any other means of identification making it possible to obtain relevant information from the manufacturer;
c) IEC 60439-1;
d) type of current (and frequency, in the case of a.c.);
e) rated operational voltages;
f) rated insulation voltages (rated impulse withstand voltage, when declared by the manufacturer);
g) rated voltages of auxiliary circuits, if applicable;
h) limits of operation;
j) rated current of each circuit, if applicable;
k) short-circuit withstand strength;
l) degree of protection;
m) measures for protection of persons;
n) service conditions for indoor use, outdoor use or special use, if different from the usual service conditions.
Pollution degree when declared by the manufacturer;
o) types of system earthing (neutral conductor) for which the ASSEMBLY is designed;
p) dimensions given preferably in the order of height, width (or length), depth;
q) weight;
r) form of internal separation;
s) types of electrical connections of functional units;
t) environment 1 or 2.
[ABB]Стандарт МЭК 60439-1 определяет номинальные характеристики НКУ, условия эксплуатации, требования к механической части конструкции, а также следующие параметры:
• изоляция;
• превышение температуры;
• прочность к воздействию тока короткого замыкания;
• защита от поражения электрическим током;
• степень защиты, обеспечиваемая оболочкой;
• комплектующие элементы, внутреннее разделение НКУ ограждениями и перегородками, электрические соединения внутри НКУ;
• требования к цепям питания электронного оборудования.
Информация, относящаяся к пунктам а) и b), должна быть указана на паспортной табличке, соответствующей данному стандарту.
Информация, приведенная в пунктах с) … d), должна быть указана либо на паспортной табличке, либо в технической документации изготовителя:
a) наименование изготовителя или товарный знак;
b) обозначение типа, условного номера или другого знака, позволяющих получить необходимую информацию от изготовителя;
c) МЭК 60439-1;
d) род тока (а для переменно тока и частота.);
e) номинальные рабочие напряжения;
f) номинальное напряжение изоляции (или указываемое изготовителем номинальное импульсное выдерживаемое напряжение);
g) номинальное напряжение вспомогательных цепей, если таковые имеются;
h) предельные отклонения параметров;
j) номинальный ток каждой цепи, если таковые приводят;
k) прочность к воздействию короткого замыкания;
l) степень защиты;
m) меры защиты персонала;
n) нормальные условия эксплуатации при внутренней или наружной установке, а также специальные условия эксплуатации, если они отличаются от нормальных.
Степень загрязнения, если она указывается изготовителем;
o) вид системы заземления (режим нейтрали), который был принят при проектировании НКУ;
p) размеры, приводимые в следующей последовательности: высота, ширина (или длина), глубина;
q) масса;
r) вид внутреннего разделения;
s) типы электрических соединений функциональных блоков;
t) окружающая среда 1 или 2.
[Перевод Интент]Тематики
- НКУ (шкафы, пульты,...)
EN
Англо-русский словарь нормативно-технической терминологии > electrical characteristics of assemblies
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