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1 four(-point) probe method
чотирьохзондовий метод (вимірювання питомого опору)English-Ukrainian dictionary of microelectronics > four(-point) probe method
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2 four(-point) probe method
чотирьохзондовий метод (вимірювання питомого опору)English-Ukrainian dictionary of microelectronics > four(-point) probe method
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3 method
метод (див. т-ж approach, technique) - method of short circuits time constants
- aligning method
- angle-lappingmethod
- angle-lapmethod
- batch method
- Bridgeman-Stockbarger method
- computerized reliability analysis method
- critical path method
- crucibleless method
- CZ Czochralski method
- CZ method
- directional etch method
- double-crucible method
- edge-based method
- epitaxial isolation method
- event-driven method
- Euler’s method
- fault driven method
- finite-difference method
- finite-element method
- flip-chip method
- floating -zone method
- float -zone method
- four-point probe method
- four probe method
- greedy method
- Green function method
- hand-drafted method
- horizontal Bridgeman method
- LEC liquid encapsulated Czochralski method
- LEC method
- low-pressure triode method
- manufacturing method
- masking method
- MCmethod
- method modified nodal analysis method
- Monte-Carlo method
- noncontact method
- over-under probe method
- photolithography method
- photomasking method
- scan direct access method
- scan-path method
- screening method
- self-aligning method
- silicon compiler method
- single-mask method
- standard-сеll method
- standing-wave method
- state variable method
- step-and-repeat multilens method
- step-and-repeat multiple-pinhole method
- symbolic layout method
- weak beam method
- wire method
- wire-wrap method -
4 technique
1) метод, спосіб (див. т-ж арproach, method) 2) технологія (див. т-ж technology) - alloying technique
- annular sawing technique
- assembly technique
- automatic layout technique
- automatic test generation technique
- BIMOS technique
- bond etchback technique
- boron etch stop technique
- bump-metallization technique
- CAD technique
- GDI technique
- chip floorplan technique
- chip processing technique
- circuit technique
- CMOS technique
- cold-crucible technique
- cold-processing technique
- collector-diffusion isolation technique
- commutating auto-zeroing technique
- computerized design technique
- CVD technique
- decomposition technique
- definition technique
- development advanced rate technique
- diffused planar technique
- diffusion technique
- double-diffusion technique
- dry processing technique
- electrochemical passivation technique
- electron-beam technique
- electroplating technique
- etch-and-refill technique
- etchback technique
- etch-stop technique
- evaporation technique
- fabrication technique
- film technique
- flip-chip technique
- floating crucible technique
- folding technique
- four-point probe technique
- growth technique
- implant-isolation technique
- incremental time technique
- integrated technique
- interconnection technique
- internal trace technique
- ion-implantation technique
- isolation technique
- laser selective photoionisation technique
- laser-trimming technique
- lifting technique
- lift-off technique
- light-scattering technique
- liquid encapsulation Czochralski technique
- liquid-phase epitaxy technique
- liquid epitaxy technique
- lithographic technique
- masked diffusion technique
- masking technique
- mask-making technique
- masterslice technique
- mesa-fabrication technique
- Minimod technique
- mixed-level technique
- mixed-mode technique
- modified horizontal Bridgman technique
- modified Bridgman technique
- molecular-beam epitaxy technique
- monolithic technique
- mounting technique
- multichip assembly technique
- multiwire technique
- native охide technique
- node tearing technique
- n-type doping technique
- open-tube diffusion technique
- open-tube technique
- optical alignment technique
- oxide masking technique
- oxygen-plasma охidation technique
- packaging technique
- peripheral sawing technique
- photolithographic technique
- photomasking technique
- photomechanical technique
- photoresist lift-off technique
- piecewise linear modeling technique
- planar-epitaxial technique
- plasma-охidation technique
- plasma-spraying technique
- p-n junction isolation technique
- positive photoresist masking technique
- probe technique
- processing technique
- production technique
- production soldering technique
- reduction technique
- resist technique
- SBC technique
- scaling technique
- screen-printing technique
- screen-stencil technique
- self-aligned double-diffusion technique
- serial-writing technique
- shallow V-groove technique
- shrinking technique
- silk-screeningtechnique
- silk-screentechnique
- single-layer interconnection technique
- single-level interconnection technique
- sinking technique
- slice technique
- solder reflow technique
- solute-diffusion technique
- SOS isolation technique
- sparse matrix technique
- staged-diffusion technique
- staining technique
- stencil technique
- step-and-repeat reduction technique
- tape-carrier technique
- test technique
- thermal wave technique
- trench-etch technique
- tri-mask technique
- trimming technique
- two-layer resist technique
- two-phase technique
- two-step technique
- vapor-oxidation technique
- vapor-phase epitaxial technique
- V-ATC technique
- wet technique
- wire-bonding technique
- wire-wrapping technique
- wire-wrap technique
- wiring technique
- 1:1 photomasking techniqueEnglish-Ukrainian dictionary of microelectronics > technique
См. также в других словарях:
four-probe method — keturzondis metodas statusas T sritis Standartizacija ir metrologija apibrėžtis Legiruotųjų puslaidininkinių sluoksnių savitosios varžos matavimo keturiais vienodu atstumu sluoksnio paviršiuje esančiais zondais būdas. atitikmenys: angl. four… … Penkiakalbis aiškinamasis metrologijos terminų žodynas
four-probe method — keturių zondų metodas statusas T sritis fizika atitikmenys: angl. four probe method vok. Viersondenmethode, f rus. метод четырёх зондов, m; четырёхзондовый метод, m pranc. méthode de sonde à quatre points, f … Fizikos terminų žodynas
Four-terminal sensing — (4T sensing) or 4 point probes method is an electrical impedance measuring technique that uses separate pairs of current carrying and voltage sensing electrodes to make more accurate measurements than traditional two terminal (2T) sensing. 4T… … Wikipedia
Kelvin probe force microscope — Kelvin probe force microscopy ( KPFM ), also known as surface potential microscopy, is a noncontact variant of atomic force microscopy (AFM) that was [http://dns.ntu ccms.ntu.edu.tw/references/APPL PHYS LETT 58 2921 1991.pdf invented] in 1991.… … Wikipedia
Molecular Inversion Probe — (MIP)[1] belongs to the class of Capture by Circularization molecular techniques [1] for performing genomic partitioning, a process through which one captures and enriches specific regions of the genome[2]. Probes used in this technique are… … Wikipedia
Viersondenmethode — keturzondis metodas statusas T sritis Standartizacija ir metrologija apibrėžtis Legiruotųjų puslaidininkinių sluoksnių savitosios varžos matavimo keturiais vienodu atstumu sluoksnio paviršiuje esančiais zondais būdas. atitikmenys: angl. four… … Penkiakalbis aiškinamasis metrologijos terminų žodynas
Vierspitzenmethode — keturzondis metodas statusas T sritis Standartizacija ir metrologija apibrėžtis Legiruotųjų puslaidininkinių sluoksnių savitosios varžos matavimo keturiais vienodu atstumu sluoksnio paviršiuje esančiais zondais būdas. atitikmenys: angl. four… … Penkiakalbis aiškinamasis metrologijos terminų žodynas
Vierspitzenverfahren — keturzondis metodas statusas T sritis Standartizacija ir metrologija apibrėžtis Legiruotųjų puslaidininkinių sluoksnių savitosios varžos matavimo keturiais vienodu atstumu sluoksnio paviršiuje esančiais zondais būdas. atitikmenys: angl. four… … Penkiakalbis aiškinamasis metrologijos terminų žodynas
keturzondis metodas — statusas T sritis Standartizacija ir metrologija apibrėžtis Legiruotųjų puslaidininkinių sluoksnių savitosios varžos matavimo keturiais vienodu atstumu sluoksnio paviršiuje esančiais zondais būdas. atitikmenys: angl. four probe method vok.… … Penkiakalbis aiškinamasis metrologijos terminų žodynas
technique à quatre électrodes — keturzondis metodas statusas T sritis Standartizacija ir metrologija apibrėžtis Legiruotųjų puslaidininkinių sluoksnių savitosios varžos matavimo keturiais vienodu atstumu sluoksnio paviršiuje esančiais zondais būdas. atitikmenys: angl. four… … Penkiakalbis aiškinamasis metrologijos terminų žodynas
метод четырех зондов — keturzondis metodas statusas T sritis Standartizacija ir metrologija apibrėžtis Legiruotųjų puslaidininkinių sluoksnių savitosios varžos matavimo keturiais vienodu atstumu sluoksnio paviršiuje esančiais zondais būdas. atitikmenys: angl. four… … Penkiakalbis aiškinamasis metrologijos terminų žodynas