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deep+level+transient+spectroscopy

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  • Deep-level transient spectroscopy — (DLTS) is an experimental tool for studying electrically active defects (known as charge carrier traps) in semiconductors. DLTS establishes fundamental defect parameters and measures their concentration in the material. Some of the parameters are …   Wikipedia

  • deep level transient spectroscopy — relaksacinė giliųjų lygmenų spektroskopija statusas T sritis radioelektronika atitikmenys: angl. deep level transient spectroscopy vok. transiente Spektroskopie tiefer Niveaus, f rus. релаксационная спектроскопия глубоких уровней, f pranc.… …   Radioelektronikos terminų žodynas

  • Spectroscopy — Analysis of white light by dispersing it with a prism is example of spectroscopy. Spectroscopy ( …   Wikipedia

  • spectroscopy — spectroscopist /spek tros keuh pist/, n. /spek tros keuh pee, spek treuh skoh pee/, n. the science that deals with the use of the spectroscope and with spectrum analysis. [1865 70; SPECTRO + SCOPY] * * * Branch of analysis devoted to identifying… …   Universalium

  • DLTS — Deep Level Transient Spectroscopy (Academic & Science » Electronics) * Data Link Test Set (Governmental » Military) …   Abbreviations dictionary

  • Thermally stimulated current — (TSC) spectroscopy is an important technique used to study energy levels in semiconductors or insulators (organic or inorganic). Energy levels are first filled either by optical or electrical injection usually at a relatively low temperature,… …   Wikipedia

  • List of materials analysis methods — List of materials analysis methods: Contents: Top · 0–9 · A B C D E F G H I J K L M N O P Q R S T U V W X Y Z μSR see Muon spin spectroscopy …   Wikipedia

  • Capacitance — Electromagnetism Electricity · …   Wikipedia

  • Lau Wai Shing — Wai Shing Lau (simplified Chinese name: 刘偉成, born July 29, 1955 in Hong Kong) is also known as Lau Wai Shing. The family name of Lau is sometimes spelled as Liu like Liu Bang (founder of the Han dynasty) or Liu Shaoqi or Liu Bocheng. This is… …   Wikipedia

  • Failure analysis — is the process of collecting and analyzing data to determine the cause of a failure. It is an important discipline in many branches of manufacturing industry, such as the electronics industry, where it is a vital tool used in the development of… …   Wikipedia

  • p-n junction — A silicon p–n junction with no applied voltage. A p–n junction is formed at the boundary between a P type and N type semiconductor created in a single crystal of semiconductor by doping, for example by ion implantation, diffusion of dopants, or… …   Wikipedia

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