ATPG

См. также в других словарях:

• ATPG — Automatic Test Pattern Generation (Academic & Science » Electronics) …   Abbreviations dictionary

• ATPG — Automatic Test Pattern Generation …   Acronyms

• ATPG — Automatic Test Pattern Generation …   Acronyms von A bis Z

• ATPG — • Automatic Test Program Generator …   Maritime acronyms and abbreviations

• Automatic test pattern generation — ATPG (acronym for both Automatic Test Pattern Generation and Automatic Test Pattern Generator) is an electronic design automation method/technology used to find an input (or test) sequence that, when applied to a digital circuit, enables testers… …   Wikipedia

• GATTO — is a genetic algorithm for automatic test pattern generation (ATPG) for testing of VLSI circuits. See also *ATPG *VLSI *Genetic Algorithms *Programming …   Wikipedia

• ATP Oil and Gas — Infobox Company name = ATP Oil Gas Corporation type = Public (nasdaq|ATPG) genre = foundation = 1991 founder = T. Paul Buhlman location city = Houston, Texas location country = U.S. location = locations = area served = key people = T. Paul… …   Wikipedia

• Electronic design automation — (EDA) is the category of tools for designing and producing electronic systems ranging from printed circuit boards (PCBs) to integrated circuits. This is sometimes referred to as ECAD (electronic computer aided design) or just CAD. (Printed… …   Wikipedia

• Synopsys — Not to be confused with Synopsis Infobox Company company name = Synopsys, Inc. company company type = Public foundation = 1986 location = key people = Aart J. de Geus, CEO/Chairman Chi Foon Chan, President/COO num employees = 5,130 (October 2006) …   Wikipedia

• Stuck-at fault — A Stuck at fault is a particular fault model used by fault simulators and Automatic test pattern generation (ATPG) tools to mimic a manufacturing defect within an integrated circuit. Individual signals and pins are assumed to be stuck at Logical… …   Wikipedia

• Design For Test — (aka Design for Testability or DFT ) is a name for design techniques that add certain testability features to a microelectronic hardware product design. The premise of the added features is that they make it easier to develop and apply… …   Wikipedia